F02600 - SEMI F26 - グレード10/0.2　有毒特殊ガスの粒子に関する仕様 Revision:SEMI F26-0697 (Reapproved 0712) - Superseded how the data is represented

Name: F02600 - SEMI F26 - グレード10/0.2 有毒特殊ガスの粒子に関する仕様 Revision:SEMI F26-0697 (Reapproved 0712) - Superseded how the data is represented
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Description

how the data is represented within the message

etched or passivated

Wafer near-edge geometry can significantly affect the yield of semiconductor device processing

from which the majority carrier concentration can be obtained

SEMI E134-0923 (technical revision)

F02600 - SEMI F26 - グレード10/0.2　有毒特殊ガスの粒子に関する仕様 Revision:SEMI F26-0697 (Reapproved 0712) - Superseded how the data is representedglobal Gases Technical Committee2012618global Audits and Reviews Subcommittee20127www. semiviews. org www. semi. org1997620033 10 0. 2 8 105 Pa 88 105 Pa 8 NH3 AsH3 PH3 Referenced SEMI Standards None.

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