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G00500 - SEMI G5 - 仕様 セラミックチップキャリア(CCC) Revision:SEMI G5-87 - Inactive SEMI F5 — Guide for

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Description

SEMI F5 — Guide for Gaseous Effluent Handling

SEMI M1-0211 (technical revision)

1  This Test Method describes the standard method for measuring the thickness of silver plating on semiconductor leadframes

4-95 (first published)

9-0697 (technical revision)

G00500 - SEMI G5 - 仕様 セラミックチップキャリア(CCC) Revision:SEMI G5-87 - Inactive SEMI F5 — Guide forReferenced SEMI Standards SEMI G6 Test Method for Seal Ring Flatness SEMI G8 Test Method for Gold Plating Quality SEMI G25 Test Method for Measuring the Resistance of Package Leads

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